This product is used for testing access to document shredders. The Jointed Accessibility Wedge Probe is a high precision probe made in exact accordance with UL and IEC standards such as UL60950 Figuren NAF2 and NAF3.
Contact：Eason Wang
Phone：+86-755-13751010017
E-mail：info@iec-equipment.com
Add：1F Junfeng Building, Gongle, Xixiang, Baoan District, Shenzhen, Guangdong, China
Nina She